Nano-View(韓國)

NanoView

韓國Nano-Viewwww.nano-view.com韓國NanoView公司在橢偏儀領(lǐng)域不斷創(chuàng)新，擁有多項專利技術(shù)。多年來一直致力于高性能橢偏儀的研制與生產(chǎn)，其產(chǎn)品主要用于半導(dǎo)體、導(dǎo)體、介質(zhì)和液體薄膜的厚度、光學(xué)特性、成分比例和表面粗糙度等測量和分析，也可用于半導(dǎo)體器件和FPD顯示等領(lǐng)域。目前主要產(chǎn)品分光橢偏儀，以獨特的設(shè)計和無需校準(zhǔn)等多項先進(jìn)專利技術(shù)，使得測試時間大大減少的同時極大地增加了測 量精度。開發(fā)的多傳感頭的分光橢偏儀，用于半導(dǎo)體和顯示器生產(chǎn)線的在線Mapping分析。Nano-Viewisdevelopingandproducingthestateoftheartequipmentsthatcanmeasureandanalyzethethickness,opticalproperties,compositionratioandthesurfaceroughnessofthesemiconductor,conductor,dielectricandliquidthinfilmsthatareusedinsemiconductordevices,LCDdisplayandsolarcell.Ourcurrentmainproductsarethespectroscopicellipsometersthatcangreatlyreducethemeasurementtimeandincreasetheaccuracyasaresultofourpatented'calibrationandalignmentfree'method.Highspeedmeasurementisalsopossiblebyusingamultichanneldetector.Wealsoreducedthesizeoftheequipmentgreatlysothatthefootprintisminimal.Themeasurementandtheanalysiscanbevery